The Canadian Centre for Electron Microscopy (CCEM) provides a suite of world-class electron microscopy capabilities and expertise to our user base of materials researchers working in a broad range of research areas, from nuclear materials safety and reliability to the development of new medical devices. Infrastructure within the CCEM includes instruments for both scanning electron microscopy (SEM) and transmission electron microscopy (TEM), as well as the only instrument for 3D Atom Probe Tomography in Canada. Associated sample preparation infrastructure, including a focused ion beam (FIB) apparatus, is available so that electron microscopy investigations can be as comprehensive as possible. The two state-of-the-art aberration-corrected TITAN TEMs allow for imaging and analysis with unprecedented spatial resolution. These instruments are among the most scientifically productive anywhere in the world; expert technical staff enable the optimal use of this unique infrastructure.